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A compact model for early electromigration failures of copper dual-damascene interconnects.
Microelectron Reliab. 2011 Sep;51(9-11):1573-1577. doi: 10.1016/j.microrel.2011.07.049.
Microelectron Reliab. 2011.
PMID: 21966026
Free PMC article.
Applications of Fracture Mechanics to Quantitative Accelerated Life Testing of Plastic Encapsulated Microelectronics.
Evans JW, Sinha K.
Evans JW, et al.
Microelectron Reliab. 2018 Jan;80:317-327. doi: 10.1016/j.microrel.2017.10.022. Epub 2017 Nov 3.
Microelectron Reliab. 2018.
PMID: 32817998
Free PMC article.
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Electromigration failure in a copper dual-damascene structure with a through silicon via.
de Orio RL, Ceric H, Selberherr S.
de Orio RL, et al.
Microelectron Reliab. 2012 Sep;52(9-10):1981-1986. doi: 10.1016/j.microrel.2012.07.021.
Microelectron Reliab. 2012.
PMID: 23564974
Free PMC article.
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Impact of Single pMOSFET Dielectric Degradation on NAND Circuit Performance.
Estrada D, Ogas ML, Southwick RG, Price PM, Baker RJ, Knowlton WB.
Estrada D, et al.
Microelectron Reliab. 2008 Mar;48(3):354-363. doi: 10.1016/j.microrel.2007.09.002.
Microelectron Reliab. 2008.
PMID: 19255611
Free PMC article.
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