Time-Multiplexed 1687-Network for Test Cost Reduction

Ansari, MA; Jung, J; Kim, D; Park, S

Ansari, MA (reprint author), Hanyang Univ, Dept Comp Sci & Engn, Seoul 426791, South Korea.

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2018; 37 (8): 1681

Abstract

The reconfigurable scan network standardized by IEEE std. 1687 offers flexibility in accessing the on-chip instruments, which significantly improves t......

Full Text Link