Multi-pass approach to reduce cone-beam artifacts in a circular orbit cone-beam CT system

Han, C; Baek, J

Baek, J (reprint author), Yonsei Univ, Sch Integrated Technol, Incheon, South Korea.

OPTICS EXPRESS, 2019; 27 (7): 10108

Abstract

We propose a multi-pass approach to reduce cone-beam artifacts in a circular orbit cone-beam computed tomography (CT) system. Employing a large 2D det......

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