Design of Reliable DNN Accelerator with Un-reliable ReRAM

Long, Y; She, XY; Mukhopadhyay, S

Long, Y (reprint author), Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA.

2019 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE), 2019; (): 1769

Abstract

This paper presents an algorithmic approach to design reliable ReRAM based Processing-in-Memory (PIM) architecture for Deep Neural Network (DNN) accel......

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