Result Filters
IEEE design & test
- Author(s):
- Institute of Electrical and Electronics Engineers
- IEEE Circuits and Systems Society
- IEEE Council on Electronic Design Automation
- IEEE Solid-State Circuits Society
- IEEE Computer Society Technical Council on Test Technology
- NLM Title Abbreviation:
- IEEE Des Test
- Title(s):
- IEEE design & test.
- Other Title(s):
- IEEE design and test
- Continues:
- IEEE design & test of computers ISSN 0740-7475
- Publication Start Year:
- 2013
- Frequency:
- Six issues yearly
- Country of Publication:
- United States
- Publisher:
- New York, NY : Institute of Electrical and Electronics Engineers
-
Language:
- English
- ISSN:
- 2168-2364 (Electronic)
2168-2356 (Print)
- LCCN:
- 2012200562
- Electronic Links:
- Access not provided by NLM
- In:
- PubMed: Selected citations only
- Current Indexing Status:
- Not currently indexed for MEDLINE. Citations are for articles where the manuscript was deposited in PubMed Central (PMC) in compliance with public access policies. For further information, see Author Manuscripts in PMC.
- Notes:
- Also issued in print.
Publication of the IEEE Circuits and Systems Society, IEEE Council on Electronic Design Automation, IEEE Solid State Circuits Society, and the IEEE Test Technology Technical Council.
- Collection Status:
- Not in the NLM Collection
- NLM ID:
- 101708213 [Serial]