Result Filters
IEEE transactions on reliability
- Author(s):
- Institute of Electrical and Electronics Engineers Professional Technical Group on Reliability
- IEEE Reliability Group
- IEEE Reliability Society
- American Society for Quality Control Electronics Division
- NLM Title Abbreviation:
- IEEE Trans Reliab
- Title(s):
- IEEE transactions on reliability / Professional Technical Group on Reliability.
- Other Title(s):
- Institute of Electrical and Electronics Engineers transactions on reliability
Transactions on reliability
Reliability - Continues:
- IRE transactions on reliability and quality control ISSN 0097-4552
- Publication Start Year:
- 1963
- Frequency:
- Quarterly, <1999- >
- Country of Publication:
- United States
- Publisher:
- [New York, N.Y. : Institute of Electrical and Electronics Engineers, c1963-
- Description:
- v. : ill. ; 28 cm.
-
Language:
- English
- ISSN:
- 0018-9529 (Print)
1558-1721 (Electronic)
0018-9529 (Linking)
- Coden:
- IEERAJ
- LCCN:
- 57048223
- Electronic Links:
- Access not provided by NLM
- In:
- Chemical abstracts
PubMed: Selected citations only
- Current Indexing Status:
- Not currently indexed for MEDLINE. Citations are for articles where the manuscript was deposited in PubMed Central (PMC) in compliance with public access policies. For further information, see Author Manuscripts in PMC.
- Notes:
- Title from cover.
Also issued online.
Vols. for 1963- issued by the Institute of Electrical and Electronics Engineers, Professional Technical Group on Reliability: <Oct. 1975>- by the IEEE Reliability Group; <1979- > by the IEEE Reliability Society.
Vol. for <1975- > published also as the journal of the Electronics Division, American Society for Quality Control.
- Other ID:
- (OCoLC)01752560
- Collection Status:
- Not in the NLM Collection
- NLM ID:
- 101212336 [Serial]