Enhanced nFinFET ESD Performance

Lee, JH; Prabhu, M; Iyer, NM; Banghart, E; Li, Y; Yu, RH; Poro, R; Hogle, N; Gebreselaie, E; Pandey, SM; Gauthier, R

Lee, JH (reprint author), GLOBALFOUNDRIES Inc, 400 Stonebreak Rd Extens, Malta, NY 12020 USA.

2017 39TH ELECTRICAL OVERSTRESS/ELECTROSTATIC DISCHARGE SYMPOSIUM (EOS/ESD), 2017; ( ):

Abstract

A very simple and useful scheme to enhance the ESD performance of the nFinFET is proposed. By incorporating the N-Well (NW) with the nFinFET, it becom......

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