Investigation of Performance Degradation in 600-V HD-GITs Under Power Cycling Tests

Huang, X; Sun, PJ; He, ZY; Lu, GG; Du, X; Luo, QM

Sun, PJ (通讯作者),Chongqing Univ, State Key Lab Power Transmiss Equipment & Syst Sec, Chongqing 400044, Peoples R China.;He, ZY (通讯作者),China Elect Prod Reliabil & Environm Testing Res I, Sci & Technol Reliabil Phys & Applicat Elect Compo, Guangzhou 510610, Peoples R China.

IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS, 2023; 11 (1): 1111

Abstract

Hybrid drain-embedded gate injection transistors (HD-GITs) are one of the most promising technologies for normally-OFF operation. However, the relevan......

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