Error Analysis of NIST SP 800-22 Test Suite

Chen, DY; Chen, H; Fan, LM; Luo, K

Fan, LM (通讯作者),Chinese Acad Sci, Inst Software, TCA Lab, Beijing 100190, Peoples R China.

IEEE TRANSACTIONS ON INFORMATION FORENSICS AND SECURITY, 2023; 18 (): 3745

Abstract

Statistical tests for randomness play an essential role in cryptography, but the reliability of these tests is rarely taken into account, which may mi......

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