Contact Spots Analysis of Sealed Relay Contact Pair Based on Contact Difference-Plane

Li, WH; Li, QZ; Zhao, ZY; Pan, RZ; Lu, WJ

Pan, RZ (corresponding author), Hebei Univ Technol, State Key Lab Reliabil & Intelligence Elect Equip, 8 Guang Rong St, Tianjin, Peoples R China.

IEEJ TRANSACTIONS ON ELECTRICAL AND ELECTRONIC ENGINEERING, 2021; 16 (3): 355