Cryo-EXLO Manipulation of FIB Specimens for Cryo-TEM

Giannuzzi, LA; Colletta, M; Yu, Y; Kourkoutis, LF; Iams, AD; Beggs, K; Kassab, AJ

Giannuzzi, LA (通讯作者),EXpressLO LLC, 5483 Lee St Unit 12, Lehigh Acres, FL 33971 USA.

MICROSCOPY AND MICROANALYSIS, 2023; 29 (1): 145

Abstract

This work describes cryogenic ex situ lift out (cryo-EXLO) of cryogenic focused ion beam (cryo-FIB) thinned specimens for analysis by cryogenic transm......

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