High-precision CD measurement using energy-filtering SEM techniques

Bizen, D; Sakakibara, M; Suzuki, M; Momonoi, Y; Kawano, H

Bizen, D (reprint author), Hitachi Ltd, 1-280 Higashi Koigakubo, Kokubunji, Tokyo 1858601, Japan.

METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXXI, 2017; 10145 ( ):

Abstract

Voltage contrast (VC) images obtained using an energy filter (EF) were used to measure the bottom surface of high-aspect-ratio (HAR) structures. The V......

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