Reliability-aware Garbage Collection for Hybrid HBM-DRAM Memories

Liu, WJ; Akram, S; Sartor, JB; Eeckhout, L

Liu, WJ (corresponding author), Univ Ghent, ELLS Dept, iGent, Technol Pk 126, B-9052 Zwijnaarde, Belgium.

ACM TRANSACTIONS ON ARCHITECTURE AND CODE OPTIMIZATION, 2021; 18 (1):

Abstract

Emerging workloads in cloud and data center infrastructures demand high main memory bandwidth and capacity. Unfortunately, DRAM alone is unable to sat......

Full Text Link