A re-evaluation of diffraction from Si(111) 7 x 7: decoding the encoded phase information in the 7 x 7 diffraction pattern

Demuth, JE

Demuth, JE (corresponding author), Thomas J Watson Res Ctr, IBM Res Div, Yorktown Hts, NY 10598 USA.

PHYSICAL CHEMISTRY CHEMICAL PHYSICS, ; ():

Abstract

The diffraction features of Si(111) 7 x 7 are analyzed and related to various structural models of the Si(111) 7 x 7 surface as one part of a multivar......

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