NBT STRESS AND RADIATION RELATED DEGRADATION AND UNDERLYING MECHANISMS IN POWER VDMOSFETS

Davidovic, V; Dankovic, D; Golubovic, S; Djoric-Veljkovic, S; Manic, I; Prijic, Z; Prijic, A; Stojadinovic, N

Djoric-Veljkovic, S (reprint author), Univ Nis, Fac Civil Engn & Architecture, Aleksandra Medvedeva 14, Nish 18000, Serbia.

FACTA UNIVERSITATIS-SERIES ELECTRONICS AND ENERGETICS, 2018; 31 (3): 367

Abstract

In this paper we provide an overview of instabilities observed in commercial power VDMOSFETs subjected to irradiation, NBT stress, and to consecutive ......

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