Pin-pin ESD protection for electro-explosive device under severe human body ESD

Lv, ZX; Yan, N; Bao, BL

Yan, N (reprint author), Beijing Inst Technol, State Key Lab Explos Sci & Technol, Beijing 100081, Peoples R China.

MICROELECTRONICS RELIABILITY, 2017; 75 ( ): 37

Abstract

Electrostatic discharge (ESD) may introduce huge damages to electro-explosive devices (EEDs). This paper studies the pin-pin ESD protection for EED un......

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