AC RTN: Testing, Modeling, and Prediction

Tok, KH; Zhang, J; Brown, J; Ye, ZL; Ji, ZG; Zhang, WD; Marsland, JS

Zhang, J (通讯作者),Liverpool John Moores Univ, Sch Engn, Liverpool L3 3AF, Merseyside, England.

IEEE TRANSACTIONS ON ELECTRON DEVICES, 2022; 69 (10): 5780