Abstract
Fu, XY; Peddireddy, D; Aggarwal, V; Jun, MBG
Aggarwal, V (通讯作者),Purdue Univ, Sch Ind Engn, W Lafayette, IN 47907 USA.;Aggarwal, V (通讯作者),Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA.
IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, 2022; 18 (9): 5882