STM-Induced SiO2 Decomposition on Si(110)

Yano, M; Uozumi, Y; Yasuda, S; Asaoka, H; Tsukada, C; Yoshida, H; Yoshigoe, A

Yano, M; Asaoka, H (reprint author), Japan Atom Energy Agcy, Adv Sci Res Ctr, 2-4 Shirakata, Tokai, Ibaraki 3191195, Japan.

E-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY, 2018; 16 (): 370

Abstract

Real-time scanning tunneling microscope (STM) measurements are performed during the thermal decomposition of an oxide layer on Si(110). Voids in which......

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