Study of LER/LWR induced V-T Variability of an E delta DC n-channel MOS Transistor

Sengupta, S; Pandit, S

Sengupta, S (reprint author), Univ Calcutta, IC Design Lab, Inst Radio Phys & Elect, Kolkata 700009, India.

PROCEEDINGS OF 2ND INTERNATIONAL CONFERENCE ON 2017 DEVICES FOR INTEGRATED CIRCUIT (DEVIC), 2017; ( ): 685

Abstract

In this paper we present a simple model to study the threshold voltage variability due to line edge roughness (LER) for an n-channel E delta DC MOS tr......

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