MIS Strip Warpage Improvement By FEA Study

Chin, SK

Chin, SK (通讯作者)，Carsem M Sdn Bhd, CTC, Lot 52986,Taman Meru Ind Estate,Jelapang POB 380, Ipoh 30720, Perak, Malaysia.

2022 IEEE 39TH INTERNATIONAL ELECTRONICS MANUFACTURING TECHNOLOGY CONFERENCE (IEMT), 2022; ():

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