Degradation characteristics of gamma-ray and proton irradiated 8T CMOS image sensors

Fu, J; Feng, J; Li, YD; Guo, Q; Wen, L; Zhou, D; Zhang, X; Cai, YL; Liu, BK

Guo, Q (corresponding author), Xinjiang Tech Inst Phys & Chem, Key Lab Funct Mat & Devices Special Environm, Urumqi 830011, Peoples R China.

RADIATION PHYSICS AND CHEMISTRY, 2021; 182 ():

Abstract

The degradation of a pinned photodiode (PPD) 8T CMOS image sensor (8T-CIS) due to total ionizing dose (TID) and displacement damage dose (DDD) have be......

Full Text Link


Links

期刊讨论 | 中国SCI论文 | 期刊主页 | 投稿经验 | 杂志官网 | 投稿链接 | 作者需知 | PMC链接 | Pubmed全文检索