An adaptive fault detection and root-cause analysis scheme for complex industrial processes using moving window KPCA and information geometric causal inference

Sun, YN; Qin, W; Zhuang, ZL; Xu, HW

Qin, W (corresponding author), Shanghai Jiao Tong Univ, Sch Mech Engn, Shanghai, Peoples R China.

JOURNAL OF INTELLIGENT MANUFACTURING, ; ():

Abstract

In recent years, fault detection and diagnosis for industrial processes have been rapidly developed to minimize costs and maximize efficiency by takin......

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