Allowable SEM noise for unbiased LER measurement

Papavieros, G; Constantoudis, V; Gogolides, E

Papavieros, G (reprint author), NCSR Demokritos, Inst Nanosci & Nanotechnol, Aghia Paraskevi, Greece.; Papavieros, G (reprint author), Nanometrisis Pc, Aghia Paraskevi, Greece.; Papavieros, G (reprint author), Aristotle Univ Thessaloniki, Phys Dept, Thess

METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXXII, 2018; 10585 ():

Abstract

Recently, a novel method for the calculation of unbiased Line Edge Roughness based on Power Spectral Density analysis has been proposed. In this paper......

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