The error correction for EMD profilometry

Wang, CX; Da, FP

Wang, CX (reprint author), Southeast Univ, Key Lab Measurement & Control CSE, Sch Automat, 2 Sipailou, Nanjing 210096, Jiangsu, Peoples R China.

FIFTH INTERNATIONAL CONFERENCE ON OPTICAL AND PHOTONICS ENGINEERING, 2017; 10449 ( ):

Abstract

A novel Empirical mode decomposition (EMD) profilometry has been developed for dynamic measurement, which can reconstruct the 3D shape of an object by......

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