Characterization of P-hit and N-hit single-event transient using heavy ion microbeam

Song, RQ; Shao, JJ; Liang, B; Chi, YQ; Chen, JJ

Shao, JJ (reprint author), Natl Univ Def Technol, Coll Comp, Changsha 410073, Hunan, Peoples R China.

IEICE ELECTRONICS EXPRESS, 2019; 16 (8):

Abstract

P-hit and N-hit single-event transients are investigated using heavy ion microbeam. A novel layout placement was implemented in the test chip to disti......

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