Tunable Holding-Voltage High Voltage ESD Devices

Lee, JH; Iyer, NM

Lee, JH (reprint author), VIS Micro Inc, Device Dept, Campbell, CA 95008 USA.

2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2019; ():

Abstract

Physical understanding of the interaction of junction depth and the location of different Drain-side N-type implants on the holding-voltage of LDNMOS ......

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