Estimation of point defects content in bulk GaN

Dementeva, EV; Orekhova, KN; Mynbaeva, MG; Zamoryanskaya, MV

Orekhova, KN (通讯作者)，Ioffe Inst, Politechn Skaya St, St Petersburg 194021, Russia.

JOURNAL OF LUMINESCENCE, 2022; 245 ():

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