Data science at farm level: Explaining and predicting within-farm variability in potato growth and yield

Mulders, PJAM; van den Heuvel, ER; van den Borne, J; van de Molengraft, R; Heemels, WPMH; Reidsma, P

Mulders, PJAM (corresponding author), Eindhoven Univ Technol, Dept Mech Engn, Control Syst Technol, POB 513, NL-5600 MB Eindhoven, Netherlands.

EUROPEAN JOURNAL OF AGRONOMY, 2021; 123 ():

Abstract

The growth and yield of crops within a farm largely vary among fields. Farms are increasing in size by acquiring smaller land parcels from different f......

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