The Impact of Duplicate Changes on Just-in-Time Defect Prediction

Duan, RF; Xu, HT; Fan, YR; Yan, M

Xu, HT (通讯作者)，Univ Sci & Technol Beijing, Sch Comp & Commun Engn, Beijing 100083, Peoples R China.;Yan, M (通讯作者)，Chongqing Univ, Sch Big Data & Software Engn, Chongqing 401331, Peoples R China.

IEEE TRANSACTIONS ON RELIABILITY, 2022; 71 (3): 1294

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