Three Terminal Common-Mode EMI Model and EMI Mitigation Strategy for Full SiC UPS

Ohn, S; Yu, JH; Rankin, P; Sun, BY; Burgos, R; Boroyevich, D; Suryanarayana, H; Belcastro, C

Ohn, S (reprint author), Virginia Tech, CPES, Blacksburg, VA 24060 USA.

2018 IEEE ENERGY CONVERSION CONGRESS AND EXPOSITION (ECCE), 2018; (): 2094

Abstract

Uninterruptible power supply (UPS) is an application in which low conduction loss and switching loss from SiC devices can largely improve the system e......

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