A Validity Index for Fuzzy Clustering Based on Bipartite Modularity

Liu, YL; Zhang, XY; Chen, JL; Chao, H

Liu, YL (reprint author), Henan Polytech Univ, Sch Comp Sci & Technol, Jiaozuo 454003, Henan, Peoples R China.

JOURNAL OF ELECTRICAL AND COMPUTER ENGINEERING, 2019; 2019 ():

Abstract

Because traditional fuzzy clustering validity indices need to specify the number of clusters and are sensitive to noise data, we propose a validity in......

Full Text Link