Flip-chip ICs SEE Testing Technique

Bobrovsky, DV; Pechenkin, AA; Novikov, AA; Chumakov, AI; Ryasnoy, NV; Churilin, YV

Bobrovsky, DV (reprint author), Natl Res Nucl Univ NRNU MEPhI, 31 Kashirskoe Shosse, Moscow 115409, Russia.; Bobrovsky, DV (reprint author), Specialized Elect Syst SPELS, 31 Kashirskoe Shosse, Moscow 115409, Russia.

2017 IEEE 30TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS (MIEL), 2017; ( ): 309

Abstract

the technique of flip-chip ICs SEE testing based on a joint use of focused laser facility and heavy ions with medium range of 100 mu m ...200 mu m is ......

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