Laser-Scanning Microscopy for Electrophoretic Mobility Characterization of Single Nanoparticles

Oorlynck, L; Ussembayev, YY; Cid, IA; Fraire, J; Hinnekens, C; Braeckmans, K; Strubbe, F

Oorlynck, L; Strubbe, F (通讯作者),Univ Ghent, Dept Elect & Informat Syst, Tech Lane Ghent Sci Pk Campus 126, B-9052 Ghent, Belgium.

PARTICLE & PARTICLE SYSTEMS CHARACTERIZATION, 2023; 40 (1):