Testing Semiconductor Products Using Low-Frequency Noise Parameters-MedSci.cn

Testing Semiconductor Products Using Low-Frequency Noise Parameters

Gorlov, MI; Sergeev, VA

Gorlov, MI (通讯作者)，Voronezh State Tech Univ, Voronezh 394006, Russia.;Sergeev, VA (通讯作者)，Russian Acad Sci, Kotelnikov Inst Radio Engn & Elect, Ulyanovsk Branch, Ulyanovsk 432073, Russia.;Sergeev, VA (通讯作者)，Ulyanovsk State Tech Univ, Ulyanovsk 432029, Russia.