Linear Ascending Metrological Algorithm

Perelshtein, MR; Kirsanov, NS; Zemlyanov, VV; Lebedev, AV; Blatter, G; Vinokur, VM; Lesovik, GB

Perelshtein, MR (corresponding author), Terra Quantum AG, St Gallerstr 16A, CH-9400 Rorschach, Switzerland.; Perelshtein, MR (corresponding author), Moscow Inst Phys & Technol, Inst Skii Pereulok 9, Dolgoprudnyi 141700, Moscow District, Russia.; Perelshtein, MR (corresponding author), Aalto Univ, QTF Ctr Excellence, Sch Sci, Dept Appl Phys, POB 15100, FI-00076 Aalto, Finland.

PHYSICAL REVIEW RESEARCH, 2021; 3 (1):

Abstract

The ubiquitous presence of shot noise sets a fundamental limit to the measurement precision in classical metrology. Recent advances in quantum devices......

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