Abstract
Yang, YA; Shih, FY; Roshan, U
Shih, FY (通讯作者),New Jersey Inst Technol, Dept Comp Sci, Newark, NJ 07102 USA.;Shih, FY (通讯作者),Asia Univ, Dept Comp Sci & Informat Engn, Taichung, Taiwan.
INTERNATIONAL JOURNAL OF PATTERN RECOGNITION AND ARTIFICIAL INTELLIGENCE, 2022; 36 (3):