X-ray structural analysis of an epitaxially grown Ag film/Si(111)root 3 x root 3-B substrate interface

Yoshiike, Y; Tajiri, H; Yamazaki, S; Nakatsujil, K; Hirayama, H

Hirayama, H (reprint author), Tokyo Inst Technol, Dept Phys, Yokohama, Kanagawa 2268502, Japan.

JAPANESE JOURNAL OF APPLIED PHYSICS, 2018; 57 (7):

Abstract

We investigated the structure of the Si(111)root 3 x root 3-B surface and epitaxially grown Ag(111) film/ surface X-ray diffraction, An analysis of th......

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