Reducing light scattering of single-layer TiO2 and single-layer SiO2 optical thin films

Pan, YQ; Liu, JZ; Gong, L; Tian, AL

Pan, YQ (corresponding author), Xian Technol Univ, Sch Photoelect Engn, Xian 710021, Peoples R China.

OPTIK, 2021; 231 ():

Abstract

The interface roughness of optical thin film is responsible for light scattering losses. Light scattering from optical thin films are becoming increas......

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