Applications of scanning electron microscopy and focused ion beam milling in dental research

House, KL; Pan, L; O'Carroll, DM; Xu, SY

Xu, SY (通讯作者)，909 River Rd, Piscataway, NJ 08854 USA.

EUROPEAN JOURNAL OF ORAL SCIENCES, 2022; 130 (2):

Abstract

The abilities of scanning electron microscopy (SEM) and focused ion beam (FIB) milling for obtaining high-resolution images from top surfaces, cross-s......

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