Characterization methods for defects and devices in silicon carbide-MedSci.cn

Characterization methods for defects and devices in silicon carbide

Bathen, ME; Lew, CTK; Woerle, J; Dorfer, C; Grossner, U; Castelletto, S; Johnson, BC

Johnson, BC (通讯作者)，RMIT Univ, Ctr Quantum Computat & Commun Technol, Sch Engn, Melbourne, Vic 3001, Australia.

JOURNAL OF APPLIED PHYSICS, 2022; 131 (14):

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