Finite-size scaling of O(n) systems at the upper critical dimensionality

Lv, JP; Xu, WW; Sun, YA; Chen, K; Deng, YJ

Lv, JP (corresponding author), Anhui Normal Univ, Dept Phys, Anhui Key Lab Optoelect Mat Sci & Technol, Key Lab Funct Mol Solids,Minist Educ, Wuhu 241000, Peoples R China.; Chen, K (corresponding author), Rutgers State Univ, Dept Phys & Astron, Piscataway, NJ 08854 USA.; Deng, YJ (corresponding author), Univ Sci & Technol China, Natl Lab Phys Sci Microscale, Hefei 230026, Peoples R China.; Deng, YJ (corresponding author), Univ Sci & Technol China, Dept Modern Phys, Hefei 230026, Peoples R China.

NATIONAL SCIENCE REVIEW, 2021; 8 (3):

Abstract

Logarithmic finite-size scaling of the O(n) universality class at the upper critical dimensionality (d(c) = 4) has a fundamental role in statistical a......

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