Sensitive multi-element profiling with high depth resolution enabled by time-of-flight recoil detection in transmission using pulsed keV ion beams-MedSci.cn

Sensitive multi-element profiling with high depth resolution enabled by time-of-flight recoil detection in transmission using pulsed keV ion beams

Holenak, R; Lohmann, S; Primetzhofer, D

Holenak, R (通讯作者)，Uppsala Univ, Dept Phys & Astron, POB 516, S-75120 Uppsala, Sweden.

VACUUM, 2022; 204 ():

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