Type-After-Type: Practical and Complete Type-Safe Memory Reuse

van der Kouwe, E; Kroes, T; Ouwehand, C; Bos, H; Giuffrida, C

van der Kouwe, E (reprint author), Leiden Univ, Leiden, Netherlands.

34TH ANNUAL COMPUTER SECURITY APPLICATIONS CONFERENCE (ACSAC 2018), 2018; (): 17

Abstract

Temporal memory errors, such as use-after-free bugs, are increasingly popular among attackers and their exploitation is hard to stop efficiently using......

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