Thickness dependence of magnetic properties of Ir/FeV-based systems

Ourdani, D; Roussigné, Y; Chérif, SM; Gabor, MS; Belmeguenai, M

Gabor, MS (通讯作者)，Tech Univ Cluj Napoca, Ctr Superconduct Spintron & Surface Sci, Phys & Chem Dept, Str Memorandumului 28, RO-400114 Cluj Napoca, Romania.

PHYSICAL REVIEW MATERIALS, 2023; 7 (3):

Abstract

Ir-buffered Fe0.7V0.3 (FeV) thin films of variable thickness (1.4 nm (sic) t(FeV) (sic) 10 nm) were sputtered on thermally oxidized Si substrate and c......

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