Benchmarking Digital Die-to-Die Channels in 2.5-D and 3-D Heterogeneous Integration Platforms

Zhang, Y; Zhang, XC; Bakir, MS

Zhang, Y (reprint author), Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA.

IEEE TRANSACTIONS ON ELECTRON DEVICES, 2018; 65 (12): 5460

Abstract

In this paper, compact circuit models and HSPICE simulations are used to benchmark die-to-die communication channels in 2.5-D and 3-D heterogeneous in......

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