An Inter-Test Cube Bit Stream Connectivity-Optimized X-Filling Approach Aiming Shift Power Reduction

Mitra, S; Das, D

Mitra, S (reprint author), Tripura Inst Technol, Dept Comp Sci & Engn, Agartala 799015, Tripura, India.

INTERNATIONAL CONFERENCE ON INTELLIGENT COMPUTING AND APPLICATIONS, ICICA 2016, 2018; 632 (): 477

Abstract

Transitions in scan cells bear much impact on the power consumption in scan-based VLSI test systems. X-filling approaches aim to fill don't care bits ......

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