Mode identification for reliability improvement of MMC

Fan, XF; Qiu, DY; Zhang, B; Chen, YF; Huang, RH; Cao, WY; Xu, SK; Fu, C; Rao, H; Li, LC

Qiu, DY (corresponding author), South China Univ Technol, Guangzhou, Peoples R China.

MICROELECTRONICS RELIABILITY, 2020; 114 ():

Abstract

In order to improve the reliability of Modular Multilevel Converters (MMC), the unexpected modes which will lead to unintended outcomes should be iden......

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