Abstract
Ma, Y; Chai, L; Jin, LZ; Yu, YF; Yan, J
Chai, L (通讯作者),Southeast Univ, Key Lab Measurement & Control Complex Syst Engn, Nanjing 210096, Peoples R China.;Chai, L (通讯作者),Southeast Univ, Sch Automat, Nanjing 210096, Peoples R China.
INTERNATIONAL JOURNAL OF PATTERN RECOGNITION AND ARTIFICIAL INTELLIGENCE, 2022; 36 (1):