On the practicability of Images Processing Methods for xMR Arrays

Meier, P; Rohrmann, K; Sandner, M; Prochaska, M

Meier, P (reprint author), Ostfalia Univ Appl Sci, Fac Elect Engn, Wolfenbuettel, Germany.

2018 IEEE 61ST INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS (MWSCAS), 2018; (): 783

Abstract

The contactless and wear-free measuring of angles, rotational speeds and currents become more important in many industrial applications. Especially in......

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